Title :
Experimental Validation of a BIST Techcnique for CMOS Active Pixel Sensors
Author :
Lizarraga, L. ; Mir, S. ; Sicard, G.
Author_Institution :
TIMA Lab., Grenoble, France
Abstract :
In this paper we present the experimental evaluation of a built-in-self-test (BIST) principle for the detection of defective pixels of a CMOS imager. The pixel BIST technique aims at an structural test based on electrical stimuli. Simple electrical test measures are considered. Test limits are set in order to minimize pixel false acceptance and false rejection under mismatch deviations. The pixel BIST is next evaluated by considering the fault coverage obtained with catastrophic and single parametric faults. Finally, test metrics obtained by simulation for mismatch deviations are compared with experimental data.
Keywords :
CMOS image sensors; built-in self test; integrated circuit testing; BIST technique; CMOS active pixel sensor; built-in-self-test; catastrophic parametric fault; electrical test measure; Built-in self-test; CMOS image sensors; CMOS technology; Circuit faults; Circuit testing; Image sensors; Light sources; Matrix converters; Optical sensors; Pixel; APS; BIST; density estimation; image sensors; photodiodes;
Conference_Titel :
VLSI Test Symposium, 2009. VTS '09. 27th IEEE
Conference_Location :
Santa Cruz, CA
Print_ISBN :
978-0-7695-3598-2
DOI :
10.1109/VTS.2009.30
