• DocumentCode
    2242119
  • Title

    Automatic Selection of Internal Observation Signals for Design Verification

  • Author

    Lv, Tao ; Li, Hua-wei ; Li, Xiao-wei

  • Author_Institution
    Key Lab. of Comput. Syst. & Archit., Chinese Acad. of Sci., Beijing, China
  • fYear
    2009
  • fDate
    3-7 May 2009
  • Firstpage
    203
  • Lastpage
    208
  • Abstract
    As the design complexity increases dramatically, results of functional simulation are usually checked through only a part of signals during design verification. It is important, therefore, to consider the observability of internal signals for effective checking. This paper proposes a static observability analysis method to automatically select internal observation signals, which improves the quality of functional verification. A series of formulas are defined to evaluate observability of internal signals, and an algorithm is proposed to locate the sources of low-observability. Such sources, rather than general hard-to-observe signals, are desirable internal observation signals. Experimental results indicate that signals selected by this method can improve the observability of designs more than those randomly selected from hard-to-observe signals.
  • Keywords
    integrated circuit design; integrated circuit testing; microprocessor chips; signal processing; automatic selection; design verification; hard-to-observe signals; internal observation signals; static observability analysis; Automatic testing; Computer bugs; Costs; Laboratories; Observability; Signal analysis; Signal design; System testing; Very large scale integration; Watches; design verification; internal observation signals; static analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2009. VTS '09. 27th IEEE
  • Conference_Location
    Santa Cruz, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-0-7695-3598-2
  • Type

    conf

  • DOI
    10.1109/VTS.2009.21
  • Filename
    5116634