DocumentCode :
2242119
Title :
Automatic Selection of Internal Observation Signals for Design Verification
Author :
Lv, Tao ; Li, Hua-wei ; Li, Xiao-wei
Author_Institution :
Key Lab. of Comput. Syst. & Archit., Chinese Acad. of Sci., Beijing, China
fYear :
2009
fDate :
3-7 May 2009
Firstpage :
203
Lastpage :
208
Abstract :
As the design complexity increases dramatically, results of functional simulation are usually checked through only a part of signals during design verification. It is important, therefore, to consider the observability of internal signals for effective checking. This paper proposes a static observability analysis method to automatically select internal observation signals, which improves the quality of functional verification. A series of formulas are defined to evaluate observability of internal signals, and an algorithm is proposed to locate the sources of low-observability. Such sources, rather than general hard-to-observe signals, are desirable internal observation signals. Experimental results indicate that signals selected by this method can improve the observability of designs more than those randomly selected from hard-to-observe signals.
Keywords :
integrated circuit design; integrated circuit testing; microprocessor chips; signal processing; automatic selection; design verification; hard-to-observe signals; internal observation signals; static observability analysis; Automatic testing; Computer bugs; Costs; Laboratories; Observability; Signal analysis; Signal design; System testing; Very large scale integration; Watches; design verification; internal observation signals; static analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2009. VTS '09. 27th IEEE
Conference_Location :
Santa Cruz, CA
ISSN :
1093-0167
Print_ISBN :
978-0-7695-3598-2
Type :
conf
DOI :
10.1109/VTS.2009.21
Filename :
5116634
Link To Document :
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