DocumentCode :
2242245
Title :
Special Session 8: New Topics: At-Speed Testing in the Face of Process Variations
Author :
Courtois, Bernard ; Visweswariah, Chandu
fYear :
2009
fDate :
3-7 May 2009
Firstpage :
237
Lastpage :
237
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2009. VTS '09. 27th IEEE
Conference_Location :
Santa Cruz, CA, USA
ISSN :
1093-0167
Print_ISBN :
978-0-7695-3598-2
Type :
conf
DOI :
10.1109/VTS.2009.72
Filename :
5116640
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2242245
