DocumentCode :
2242273
Title :
Microscale and Nanoscale Thermal Characterization of Integrated Circuit Chips
Author :
Courtois, Bernard ; Shakouri, Ali
fYear :
2009
fDate :
3-7 May 2009
Firstpage :
241
Lastpage :
241
Keywords :
Electronic packaging thermal management; High-resolution imaging; Liquid crystals; Microscopy; Optical attenuators; Optical imaging; Spatial resolution; Temperature; Thermal resistance; Ultrafast optics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2009. VTS '09. 27th IEEE
Conference_Location :
Santa Cruz, CA, USA
ISSN :
1093-0167
Print_ISBN :
978-0-7695-3598-2
Type :
conf
DOI :
10.1109/VTS.2009.73
Filename :
5116641
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2242273
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