Title :
Highly X-Tolerant Selective Compaction of Test Responses
Author :
Mrugalski, G. ; Mukherjee, N. ; Rajski, J. ; Czysz, D. ; Tyszer, J.
Author_Institution :
Mentor Graphics Corp., Wilsonville, OR, USA
Abstract :
The paper presents a new scan chain selection scheme for response compaction. The proposed solution performs selective masking of scan chains and handles a wide range of unknown state profiles, such that all X states can be eliminated in a per-cycle mode while preserving high observability of scan cells that capture errors.
Keywords :
fault tolerance; integrated circuit testing; X-tolerant selective compaction; response compaction; scan chain selection; selective masking; test data compression; Built-in self-test; Circuit testing; Compaction; Graphics; Logic testing; Observability; State feedback; Test data compression; USA Councils; Very large scale integration; X-masking; output compaction; scan chain selection; test data compression; unknown states;
Conference_Titel :
VLSI Test Symposium, 2009. VTS '09. 27th IEEE
Conference_Location :
Santa Cruz, CA
Print_ISBN :
978-0-7695-3598-2
DOI :
10.1109/VTS.2009.11
