Title :
On-Line Calibration and Power Optimization of RF Systems Using a Built-In Detector
Author :
Zhang, Chaoming ; Gharpurey, Ranjit ; Abraham, Jacob A.
Author_Institution :
Comput. Eng. Res. Center, Univ. of Texas at Austin, Austin, TX, USA
Abstract :
This paper develops a technique, using a built-in detector, for measuring the specifications of RF subsystems and fine-tuning them with a feedback control algorithm. At the same time, optimum power consumption points can be chosen from different biasing schemes. The detector has small area overhead with low frequency output. The sampled output waveform is analyzed using an FFT. The low frequency measurements are directly used to calculate the circuit specifications, without requiring learning steps. The technique was used to measure the performance parameters of a 940 MHz to 40 MHz down conversion mixer in a RF receiver front-end test chip, fabricated in a commercial 0.18 mum CMOS process. The tuning algorithm was implemented in the Labview environment, and tuning knobs on board were used for biasing and control optimization. Results show that the approach can provide accurate calibration of specifications and power for real RF chips.
Keywords :
calibration; fast Fourier transforms; frequency measurement; optimisation; power consumption; radio receivers; sensors; CMOS process; Labview environment; RF receiver front-end test chip; RF subsystems; biasing schemes; built-in detector; circuit specifications; control optimization; feedback control algorithm; frequency 940 MHz to 40 MHz; low frequency measurements; on-line calibration; optimum power consumption points; output waveform; power optimization; size 0.18 mum; tuning algorithm; tuning knobs; Calibration; Circuit optimization; Circuit testing; Detectors; Energy consumption; Feedback control; Frequency measurement; Mixers; Radio frequency; Semiconductor device measurement; Built-in test; On-line Calibration; Power Optimization; RF detector; RF test;
Conference_Titel :
VLSI Test Symposium, 2009. VTS '09. 27th IEEE
Conference_Location :
Santa Cruz, CA
Print_ISBN :
978-0-7695-3598-2
DOI :
10.1109/VTS.2009.23