Title :
Measurement of Birefringence in Nonlinear Crystals by Michelson Interferometer
Author :
Choi, Hee Joo ; Kim, Byeong Joo ; Lim, Hwan Hong ; Cha, Myoungsik
Author_Institution :
Dept. of Phys., Pusan Nat. Univ., Pusan
Abstract :
We present a method to measure the index of refraction of a wafer-type material accurately by using a modified Michelson interferometer. With this method, the difference between the refractive index of the ordinary-wave and that of the extraordinary-wave in the representative nonlinear crystal, LiNbO3 could be measured with ease.
Keywords :
Michelson interferometers; birefringence; lithium compounds; nonlinear optics; photorefractive materials; refractive index measurement; LiNbO3; Michelson interferometer; birefringence measurement; nonlinear crystals; refractive index; wafer-type material; Birefringence; Crystalline materials; Crystals; Nonlinear optics; Optical interferometry; Optical polarization; Optical refraction; Optical variables control; Refractive index; Rotation measurement;
Conference_Titel :
Lasers and Electro-Optics - Pacific Rim, 2007. CLEO/Pacific Rim 2007. Conference on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-1173-3
Electronic_ISBN :
978-1-4244-1174-0
DOI :
10.1109/CLEOPR.2007.4391322
