DocumentCode :
2242696
Title :
Sequential Variations of Fraunhofer Diffraction Pattern by Optical 4f Imaging System in As2S3 Thin Film
Author :
Yang, H.R. ; Kim, E.J. ; Kim, G.Y. ; Park, S.Y. ; Kwak, C.H.
Author_Institution :
Dept. of Phys., Yeungnam Univ., Kyongsan
fYear :
2007
fDate :
26-31 Aug. 2007
Firstpage :
1
Lastpage :
2
Abstract :
We observed sequential changes of Fraunhofer diffraction pattern due to photoinduced nonlinear refractive index changes in chalcogenide amorphous AS2S3 thin film by utilizing the optical 4f imaging system and also measured the power distribution of the temporal observed patterns.
Keywords :
Fraunhofer diffraction; optical films; optical images; refractive index; As2S3; Fraunhofer diffraction pattern; chalcogenide amorphous thin film; optical 4f imaging system; photoinduced nonlinear refractive index; sequential variations; temporal observed pattern; Amorphous materials; Nonlinear optics; Optical diffraction; Optical films; Optical imaging; Optical refraction; Optical variables control; Power distribution; Power measurement; Refractive index;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics - Pacific Rim, 2007. CLEO/Pacific Rim 2007. Conference on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-1173-3
Electronic_ISBN :
978-1-4244-1174-0
Type :
conf
DOI :
10.1109/CLEOPR.2007.4391332
Filename :
4391332
Link To Document :
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