DocumentCode :
2242711
Title :
Author index
fYear :
2009
fDate :
3-7 May 2009
Firstpage :
339
Lastpage :
341
Abstract :
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2009. VTS '09. 27th IEEE
Conference_Location :
Santa Cruz, CA
ISSN :
1093-0167
Print_ISBN :
978-0-7695-3598-2
Type :
conf
DOI :
10.1109/VTS.2009.60
Filename :
5116659
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2242711
