DocumentCode
2242711
Title
Author index
fYear
2009
fDate
3-7 May 2009
Firstpage
339
Lastpage
341
Abstract
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2009. VTS '09. 27th IEEE
Conference_Location
Santa Cruz, CA
ISSN
1093-0167
Print_ISBN
978-0-7695-3598-2
Type
conf
DOI
10.1109/VTS.2009.60
Filename
5116659
Link To Document