• DocumentCode
    2242763
  • Title

    Fast Search Method for Image Vector Quantization Based on Equal-Average Equal-Variance and Partial Sum Concept

  • Author

    Pan, Zhibin ; Kotani, Koji ; Ohmi, Tadahiro

  • Author_Institution
    New Ind. Creation Hatchery Center, Tohoku Univ., Sendai
  • fYear
    2005
  • fDate
    6-6 July 2005
  • Firstpage
    1440
  • Lastpage
    1443
  • Abstract
    The encoding process of image vector quantization (VQ) is very heavy due to it performing a lot of k-dimensional Euclidean distance computations. In order to speed up VQ encoding, it is most important to avoid unnecessary exact Euclidean distance computations as many as possible by using features of a vector to estimate how large it is first so as to reject most of unlikely codewords. The mean, the variance, L 2 norm and partial sum of a vector have been proposed as effective features in previous works for fast VQ encoding. Recently, in the previous work (Z. Lu et al., 2003), three features of the mean, the variance and L2 norm are used together to derive an EEENNS search method, which is very search efficient but still has obvious computational redundancy. This paper aims at modifying the results of EEENNS method further by introducing another feature of partial sum to replace L2 norm feature so as to reduce more search space. Mathematical analysis and experimental results confirmed that the proposed method is more search efficient compared to (Z. Lu et al., 2003)
  • Keywords
    feature extraction; image coding; vector quantisation; EEENNS search method; VQ; computational redundancy; encoding process; equal-average equal-variance; image vector quantization; k-dimensional Euclidean distance; partial sum concept; vector feature estimation; Decoding; Distortion measurement; Electronic mail; Electronics industry; Euclidean distance; Image coding; Industrial electronics; Mathematical analysis; Search methods; Vector quantization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia and Expo, 2005. ICME 2005. IEEE International Conference on
  • Conference_Location
    Amsterdam
  • Print_ISBN
    0-7803-9331-7
  • Type

    conf

  • DOI
    10.1109/ICME.2005.1521702
  • Filename
    1521702