Title :
Influence of Photo and thermal-bleaching on pre-irradiation low water peak single mode fibers
Author :
Yin, Jianchong ; Wen, Jianxiang ; Luo, Wenyun ; Xiao, Zhongyin ; Chen, Zhenyi ; Wang, Tingyun
Author_Institution :
Key Lab. of Specialty Fiber Opt. & Opt. Access Networks, Shanghai Univ., Shanghai, China
Abstract :
Reducing the radiation-induced transmission loss in low water peak single mode fiber (LWP SMF) has been investigated by using photo-bleaching method with 980nm pump light source and using thermal-bleaching method with temperature control system. The results show that the radiation-induced loss of pre-irradiation optical fiber can be reduced effectively with the help of photo-bleaching or thermal-bleaching. Although the effort of photo-bleaching is not as significant as thermal-bleaching, by using photo-bleaching method, the loss of fiber caused by radiation-induced defects can be reduced best up to 49% at 1310nm and 28% at 1550nm in low pre-irradiation condition, the coating of the fiber are not destroyed, and the rehabilitating time is just several hours, while self-annealing usually costs months´ time. What´s more, the typical high power LASER for photo-bleaching can be 980nm pump Laser Diode, which is very accessible.
Keywords :
gamma-ray effects; light sources; optical fibre losses; optical fibre testing; optical pumping; optical saturable absorption; semiconductor lasers; temperature control; thermo-optical effects; high power laser; low water peak; photobleaching; preirradiation condition; preirradiation optical fiber; pump laser diode; pump light source; radiation-induced defects; radiation-induced transmission loss; self-annealing; single mode fibers; temperature control; thermal-bleaching; wavelength 1550 nm; wavelength 980 nm; Abstracts; Bleaching; Lasers; Radiation effects; Silicon; γ-ray-irradiation; LWP SMF; loss spectrum; photo-bleaching; thermal-bleaching;
Conference_Titel :
Communications and Photonics Conference and Exhibition, 2011. ACP. Asia
Conference_Location :
Shanghai
Print_ISBN :
978-0-8194-8961-6