DocumentCode :
2242952
Title :
Through defect development in interturn insulation of low voltage windings of electric machines
Author :
Dudkin, N. ; Leonov, A.P. ; Maryin, S.S.
Author_Institution :
Tomsk Polytech. Univ., Russia
fYear :
2001
fDate :
2001
Firstpage :
122
Lastpage :
124
Abstract :
For the electric drives of lot production the problem of quality improving is the most actual. Their quality relates to their reliability and to the reliability of the mechanisms put in action by these drives. About 90% of the failures of electric drives results from the failure of the insulation system. Interturn insulation is the weakest part of this system. The failure of turn insulation is due to the presence of through defects in it, i.e. due to the defects in adhesive and enamel insulation of contiguous winding wires. The investigation of the change of physical and mechanical properties of the components of interturn insulation during heat ageing allows one to estimate the dynamics of this system stability change to cracks formation (i.e., the probability of the through defect formation). That in its turn allows one to conduct accurate estimate of the reliability of the whole system of insulation and the electric machine as a whole
Keywords :
ageing; cracks; failure analysis; machine insulation; machine windings; motor drives; probability; reliability; stability; adhesive; contiguous winding wires; cracks formation; electric drives; electric machines; enamel insulation; heat ageing; insulation system failure; interturn insulation; lot production; low voltage windings; mechanical properties; physical properties; probability; reliability; system stability dynamics; through defect development; Cable insulation; Chemicals; Dielectrics and electrical insulation; Electric machines; Large-scale systems; Low voltage; Machine windings; Polymers; Power system reliability; Synchronous motors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Modern Techniques and Technology, 2001. MTT 2001. Proceedings of the 7th International Scientific and Practical Conference of Students, Post-graduates and Young Scientists
Conference_Location :
Tomsk
Print_ISBN :
0-7803-6346-9
Type :
conf
DOI :
10.1109/MTT.2001.983763
Filename :
983763
Link To Document :
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