DocumentCode :
2242973
Title :
TRIP: Temporal Redundancy Integrated Performance Booster for Parity-Based RAID Storage Systems
Author :
Jin, Chao ; Feng, Dan ; Jiang, Hong ; Tian, Lei ; Liu, Jingning ; Ge, Xiongzi
Author_Institution :
Sch. of Comput. Sci. & Technol., Huazhong Univ. of Sci. & Technol., Wuhan, China
fYear :
2010
fDate :
8-10 Dec. 2010
Firstpage :
205
Lastpage :
212
Abstract :
Parity redundancy is widely employed in RAID-structured storage systems to protect against disk failures. However, the small-write problem has been a persistent root cause of the performance bottleneck of such parity-based RAID systems, due to the additional parity update overhead upon each write operation. In this paper, we propose a novel RAID architecture, TRIP, based on the conventional parity-based RAID systems. TRIP alleviates the small-write problem by integrating and exploiting the temporal redundancy (i.e., snapshots and logs) that commonly exists in storage systems to protect data from soft errors while boosting write performance. During the write-intensive periods, TRIP can reduce the penalty of each small-write request to as few as one device IO operation, at a minimal cost of maintaining the temporal redundant information. Reliability analysis, in terms of Mean Time to Data Loss (MTTDL), shows that the reliability of TRIP is only marginally affected. On the other hand, our prototype implementation and performance evaluation demonstrate that TRIP significantly outperforms the conventional parity-based RAID systems in data transfer rate and user response time, especially in write-intensive environments.
Keywords :
RAID; disc drives; fault tolerance; MTTDL; TRIP; disk failure; mean-time-to-data loss; parity redundancy; parity-based RAID storage system; reliability analysis; small-write problem; temporal redundancy integrated performance booster; log; parity redundancy; performance booster; small write; snapshot; temporal redundancy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Parallel and Distributed Systems (ICPADS), 2010 IEEE 16th International Conference on
Conference_Location :
Shanghai
ISSN :
1521-9097
Print_ISBN :
978-1-4244-9727-0
Electronic_ISBN :
1521-9097
Type :
conf
DOI :
10.1109/ICPADS.2010.49
Filename :
5695604
Link To Document :
بازگشت