• DocumentCode
    2243064
  • Title

    Model validation for change detection [machine vision]

  • Author

    Bejanin, M. ; Huertas, A. ; Medioni, G. ; Nevatia, R.

  • Author_Institution
    Inst. for Robotics & Intelligent Syst., Univ. of Southern California, Los Angeles, CA, USA
  • fYear
    1994
  • fDate
    5-7 Dec 1994
  • Firstpage
    160
  • Lastpage
    167
  • Abstract
    An important application of machine vision is to provide a means to monitor a scene over a period of time and report changes in the content of the scene. We have developed a validation mechanism that implements the first step towards a system for detecting changes in images of aerial scenes. By validation we mean the confirmation of the presence of model objects in the image. Our system uses a 3-D site model of the scene as a basis for model validation, and eventually for detecting changes and to update the site model. The scenario for our present validation system consists of adding a new image to a database associated with the site. The validation process is implemented in three steps: registration of the image to the model, or equivalently, determination of the position and orientation of the camera; matching of model features to image features; and validation of the objects in the model. Our system processes the new image monocularly and uses shadows as 3-D clues to help validate the model. The system has been tested using a hand-generated site model and several images of a 500:1 scale model of the site, acquired form several viewpoints
  • Keywords
    computer vision; image registration; 3-D clues; 3-D site model; change detection; image features; image registration; machine vision; model validation; validation mechanism; Condition monitoring; Image databases; Intelligent robots; Intelligent systems; Layout; Machine intelligence; Machine vision; Object oriented databases; Robot vision systems; Spatial databases;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Computer Vision, 1994., Proceedings of the Second IEEE Workshop on
  • Conference_Location
    Sarasota, FL
  • Print_ISBN
    0-8186-6410-X
  • Type

    conf

  • DOI
    10.1109/ACV.1994.341304
  • Filename
    341304