DocumentCode :
2243097
Title :
Patterning effect mitigation using complementary data for NRZ wavelength conversion with a SOA-MZI
Author :
Wang, Gang ; Yang, Xuelin ; Weng, Qiwei ; Hu, Wei Sheng
Author_Institution :
Dept. of Electron. Eng., Shanghai Jiao Tong Univ., Shanghai, China
fYear :
2011
fDate :
13-16 Nov. 2011
Firstpage :
1
Lastpage :
6
Abstract :
A novel scheme of Non-Return-to-Zero (NRZ) all-optical wavelength conversion is proposed using a semiconductor optical amplifier based Mach-Zehnder interferometer (SOA-MZI), where the complementary NRZ data is used to mitigate SOA patterning effect. The performances of the wavelength converters are numerically evaluated in terms of the waveform, eye-diagram and Q factor of the output signals at 40 Gb/s, using a time-domain SOA model. It is shown that the new complementary scheme significantly improves the Q factor of the converted signal from 3.8 to 8.1, compared with the traditional scheme.
Keywords :
Mach-Zehnder interferometers; Q-factor; optical wavelength conversion; semiconductor optical amplifiers; time-domain analysis; Mach-Zehnder interferometer; NRZ wavelength conversion; Q factor; SOA-MZI; all-optical wavelength conversion; complementary data; eye-diagram; nonreturn-to-zero; patterning effect mitigation; semiconductor optical amplifier; time-domain SOA model; Abstracts; Wavelength division multiplexing; NRZ format; patterning effect; semiconductor optical amplifiers; wavelength conversion;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications and Photonics Conference and Exhibition, 2011. ACP. Asia
Conference_Location :
Shanghai
ISSN :
2162-108X
Print_ISBN :
978-0-8194-8961-6
Type :
conf
DOI :
10.1117/12.904084
Filename :
6210662
Link To Document :
بازگشت