Title :
Control of mode Q factor and direction-emission by metal confinement for defected circular microresonators
Author :
Yao, Qi-Feng ; Lin, Jian-Dong ; Yang, Yue-De ; Huang, Yong-Zhen
Author_Institution :
State Key Lab. on Integrated Optoelectron., Inst. of Semicond., Beijing, China
Abstract :
Wavelength-scale defected circular microresonators with laterally confined metal layer are designed for directional emission from high Q confined modes by boundary element method (BEM), which is firstly applied to the multilayer structures. The influence of metal layer thickness on the mode filed patterns and Q factors are simulated. The results indicate that the thickness of the metal layer has a great effect on far-field emission patterns and the mode Q factors.
Keywords :
Q-factor; boundary-elements methods; integrated optics; laser cavity resonators; microcavities; microcavity lasers; micromechanical resonators; optical multilayers; boundary element method; confined modes; defected circular microresonators; directional emission; far-field emission patterns; laterally confined metal layer; metal confinement; mode Q factor; multilayer structures; Abstracts; Single photon emission computed tomography; BEM; defected microresonators; directional emission microlasers;
Conference_Titel :
Communications and Photonics Conference and Exhibition, 2011. ACP. Asia
Conference_Location :
Shanghai
Print_ISBN :
978-0-8194-8961-6
