Control of mode Q factor and direction-emission by metal confinement for defected circular microresonators

Author

Yao, Qi-Feng ; Lin, Jian-Dong ; Yang, Yue-De ; Huang, Yong-Zhen

Author_Institution

State Key Lab. on Integrated Optoelectron., Inst. of Semicond., Beijing, China

fYear

2011

fDate

13-16 Nov. 2011

Firstpage

1

Lastpage

6

Abstract

Wavelength-scale defected circular microresonators with laterally confined metal layer are designed for directional emission from high Q confined modes by boundary element method (BEM), which is firstly applied to the multilayer structures. The influence of metal layer thickness on the mode filed patterns and Q factors are simulated. The results indicate that the thickness of the metal layer has a great effect on far-field emission patterns and the mode Q factors.

Keywords

Q-factor; boundary-elements methods; integrated optics; laser cavity resonators; microcavities; microcavity lasers; micromechanical resonators; optical multilayers; boundary element method; confined modes; defected circular microresonators; directional emission; far-field emission patterns; laterally confined metal layer; metal confinement; mode Q factor; multilayer structures; Abstracts; Single photon emission computed tomography; BEM; defected microresonators; directional emission microlasers;

fLanguage

English

Publisher

ieee

Conference_Titel

Communications and Photonics Conference and Exhibition, 2011. ACP. Asia

Conference_Location

Shanghai

ISSN

2162-108X

Print_ISBN

978-0-8194-8961-6

Type

conf

DOI

10.1117/12.903601

Filename

6210668