Automatic Testing System for UHF Passive RFID Tag Performance

Author

Zou Wen bin ; Wu Yun ; Zhao Yong

Author_Institution

Key Lab. of Integrated Microsyst., Peking Univ., Shenzhen

Volume

2

fYear

2009

fDate

30-31 May 2009

Firstpage

79

Lastpage

82

Abstract

With the advancement of radio frequency identification technology, various RFID products are emerging in our life. More and more government agencies and retailers have realized the potential of RFID technology and have mandated or recommended their suppliers to attach RFID tags to their products. The tag performance highly determines implement of these mandates and recommendations. In this paper, we discuss an automatic testing system for UHF passive RFID tag performance. Both hardware and software architectures will be presented.

Keywords

automatic testing; radiofrequency identification; telecommunication computing; UHF passive RFID tag performance; automatic testing system; hardware architectures; radio frequency identification technology; software architectures; tag performance; Automatic testing; Backscatter; Batteries; Benchmark testing; DH-HEMTs; Electromagnetic scattering; Passive RFID tags; RFID tags; Radiofrequency identification; Supply chains; RFID; automatic testing system; benchmarking; tag performance;

fLanguage

English

Publisher

ieee

Conference_Titel

Networking and Digital Society, 2009. ICNDS '09. International Conference on

Conference_Location

Guiyang, Guizhou

Print_ISBN

978-0-7695-3635-4

Type

conf

DOI

10.1109/ICNDS.2009.100

Filename

5116689