DocumentCode
2243519
Title
Capacitive micromachined ultrasonic transducer based integrated actuator for atomic force microscope cantilevers
Author
Hæggström, Edward ; Yaralioglu, Goksen G. ; Ergun, Arif S. ; Khuri-Yakub, Pierre T.
Author_Institution
Edward L. Ginzton Lab., Stanford Univ., CA, USA
fYear
2002
fDate
2002
Firstpage
45
Lastpage
49
Abstract
The atomic force microscope (AFM) is a versatile tool for imaging and modifying surfaces on atomic scales. The core of the device is a cantilever beam with a sharp tip. The cantilever usually measures a few hundred microns in length and tens of microns in width. Many imaging or surface modification applications require actuation of this micron scale beam. In this paper, a novel actuation mechanism is introduced. The method uses radiation pressure generated by capacitive micromachined ultrasonic transducers (cMUT). The cMUTs are fabricated on top of the cantilever beams and they operate in the megahertz range generating a DC radiation pressure in the immersion medium such as water or air. The integrated cMUT cantilever system compares favorably with piezoelectric film activated and with non-integrated ultrasonic actuation schemes. The cMUT cantilever does not require any alignment of the actuator to the cantilever. Moreover, it works in air as well as in water and is readily used with parallel cantilever probes. Finally, it is an IC compatible technology solution.
Keywords
atomic force microscopy; capacitive sensors; microactuators; micromachining; radiation pressure; ultrasonic transducers; DC radiation pressure; IC compatible technology; actuation mechanism; air; atomic force microscope cantilevers; cantilever beam; cantilever beams; capacitive micromachined ultrasonic transducer based integrated actuator; capacitive micromachined ultrasonic transducers; megahertz range; parallel cantilever probes; radiation pressure; sharp tip; surfaces; ultrasonic actuation; water; Actuators; Atomic force microscopy; Atomic measurements; DC generators; Length measurement; Piezoelectric films; Structural beams; Ultrasonic imaging; Ultrasonic transducers; Ultrasonic variables measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2002. IEEE-NANO 2002. Proceedings of the 2002 2nd IEEE Conference on
Print_ISBN
0-7803-7538-6
Type
conf
DOI
10.1109/NANO.2002.1032120
Filename
1032120
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