• DocumentCode
    2243519
  • Title

    Capacitive micromachined ultrasonic transducer based integrated actuator for atomic force microscope cantilevers

  • Author

    Hæggström, Edward ; Yaralioglu, Goksen G. ; Ergun, Arif S. ; Khuri-Yakub, Pierre T.

  • Author_Institution
    Edward L. Ginzton Lab., Stanford Univ., CA, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    45
  • Lastpage
    49
  • Abstract
    The atomic force microscope (AFM) is a versatile tool for imaging and modifying surfaces on atomic scales. The core of the device is a cantilever beam with a sharp tip. The cantilever usually measures a few hundred microns in length and tens of microns in width. Many imaging or surface modification applications require actuation of this micron scale beam. In this paper, a novel actuation mechanism is introduced. The method uses radiation pressure generated by capacitive micromachined ultrasonic transducers (cMUT). The cMUTs are fabricated on top of the cantilever beams and they operate in the megahertz range generating a DC radiation pressure in the immersion medium such as water or air. The integrated cMUT cantilever system compares favorably with piezoelectric film activated and with non-integrated ultrasonic actuation schemes. The cMUT cantilever does not require any alignment of the actuator to the cantilever. Moreover, it works in air as well as in water and is readily used with parallel cantilever probes. Finally, it is an IC compatible technology solution.
  • Keywords
    atomic force microscopy; capacitive sensors; microactuators; micromachining; radiation pressure; ultrasonic transducers; DC radiation pressure; IC compatible technology; actuation mechanism; air; atomic force microscope cantilevers; cantilever beam; cantilever beams; capacitive micromachined ultrasonic transducer based integrated actuator; capacitive micromachined ultrasonic transducers; megahertz range; parallel cantilever probes; radiation pressure; sharp tip; surfaces; ultrasonic actuation; water; Actuators; Atomic force microscopy; Atomic measurements; DC generators; Length measurement; Piezoelectric films; Structural beams; Ultrasonic imaging; Ultrasonic transducers; Ultrasonic variables measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2002. IEEE-NANO 2002. Proceedings of the 2002 2nd IEEE Conference on
  • Print_ISBN
    0-7803-7538-6
  • Type

    conf

  • DOI
    10.1109/NANO.2002.1032120
  • Filename
    1032120