Title :
A simple linear technique for measuring the carrier-envelope offset phase of ultrashort pulses
Author :
Jójárt, P. ; Börzsönyi, Á ; Koke, S. ; Görbe, M. ; Osvay, K.
Author_Institution :
Dept. of Opt. & Quantum Electron., Univ. of Szeged, Szeged, Hungary
Abstract :
A spectrally resolved multiple beam interferometer is capable for measuring the carrier envelope offset phase of ultrashort laser pulses with an accuracy of 70 mrad. The performance has been cross-calibrated with a conventional f-to-2f interferometer.
Keywords :
calibration; high-speed optical techniques; laser variables measurement; optical phase shifters; optical variables measurement; phase shifting interferometry; carrier-envelope offset phase measurement; cross-calibration; optical phase shift; pectrally resolved multiple beam interferometer; ultrashort laser pulses; Laser beams; Measurement by laser beam; Optical beams; Optical interferometry; Oscillators; Phase measurement; Ultrafast optics;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2011 Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4577-1223-4
