• DocumentCode
    2244628
  • Title

    A methodology for validating digital circuits with mutation testing

  • Author

    Vado, Patrice ; Savaria, Yvon ; Zoccarato, Yannick ; Robach, Chantal

  • Author_Institution
    Dept. de Genie Electr. et Inf., Ecole Polytech. de Montreal, Que., Canada
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    343
  • Abstract
    This paper proposes a systematic methodology for improving functional validation vectors developed to check digital circuits. This method exploits the mutation testing concept originally proposed for software validation. Mutation injects specific functional transformations in circuit descriptions expressed in languages like VHDL or Verilog. These programs, called mutant, are syntactically correct but functionally incorrect. Knowing how these vectors detect functional faults improves the confidence in the design and provide information on the coverage of validation vectors. The paper identifies limits of previous work on mutation testing applied to hardware and proposes method that are better suited to the task
  • Keywords
    automatic testing; circuit analysis computing; digital integrated circuits; integrated circuit testing; VHDL; Verilog; digital circuit validation; functional faults detection; functional transformation injection; functional validation vectors; mutation testing; Circuit faults; Circuit simulation; Circuit testing; Digital circuits; Electrical fault detection; Fault detection; Formal verification; Genetic mutations; Hardware; Software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on
  • Conference_Location
    Geneva
  • Print_ISBN
    0-7803-5482-6
  • Type

    conf

  • DOI
    10.1109/ISCAS.2000.857100
  • Filename
    857100