DocumentCode
2245122
Title
Equipment and Test Results of the Electronic Components to SEE in the Temperature Range
Author
Anashin, Vasily S. ; Kozyukov, Alexander E. ; Emeliyanov, Vladimir V. ; Ozerov, Alexander I. ; Vatuev, Alexander S. ; Besetskiy, Alexey V. ; Skuratov, Vladimir A. ; Bakerenkov, Alexander S. ; Belyakov, Vladimir V.
Author_Institution
JSC Inst. of Space Device Eng., Moscow, Russia
fYear
2012
fDate
16-20 July 2012
Firstpage
1
Lastpage
5
Abstract
This paper presents SEE test facility as well as its opportunities of integrated microcircuit tests in the temperature range. The used method of heating and cooling of DUT was considered in vacuum chamber of test facility.
Keywords
integrated circuit testing; integrated circuits; test facilities; SEE test facility; electronic components; integrated microcircuit test; temperature range; vacuum chamber; Electronic components; Heating; Temperature distribution; Temperature measurement; Temperature sensors; Test facilities;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop (REDW), 2012 IEEE
Conference_Location
Tucson, AZ
ISSN
2154-0519
Print_ISBN
978-1-4673-2730-5
Type
conf
DOI
10.1109/REDW.2012.6353725
Filename
6353725
Link To Document