Title :
Equipment and Test Results of the Electronic Components to SEE in the Temperature Range
Author :
Anashin, Vasily S. ; Kozyukov, Alexander E. ; Emeliyanov, Vladimir V. ; Ozerov, Alexander I. ; Vatuev, Alexander S. ; Besetskiy, Alexey V. ; Skuratov, Vladimir A. ; Bakerenkov, Alexander S. ; Belyakov, Vladimir V.
Author_Institution :
JSC Inst. of Space Device Eng., Moscow, Russia
Abstract :
This paper presents SEE test facility as well as its opportunities of integrated microcircuit tests in the temperature range. The used method of heating and cooling of DUT was considered in vacuum chamber of test facility.
Keywords :
integrated circuit testing; integrated circuits; test facilities; SEE test facility; electronic components; integrated microcircuit test; temperature range; vacuum chamber; Electronic components; Heating; Temperature distribution; Temperature measurement; Temperature sensors; Test facilities;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2012 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4673-2730-5
DOI :
10.1109/REDW.2012.6353725
