• DocumentCode
    2245142
  • Title

    "PICO-4" Single Event Effects Evaluation and Testing Facility Based on Wavelength Tunable Picosecond Laser

  • Author

    Egorov, Andrey N. ; Chumakov, Alexander I. ; Mavritskiy, Oleg B. ; Pechenkin, Alexander A. ; Koltsov, Dmitriy O. ; Yanenko, Andrey V.

  • Author_Institution
    Specialized Electron. Syst., Moscow, Russia
  • fYear
    2012
  • fDate
    16-20 July 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Technical characteristics of "PICO-4" SEE simulation facility utilizing a tunable picosecond laser source are presented. Its capabilities aimed on simulation of single event effects under space environment in Si, GaAs, SiGe etc. microelectronic devices are discussed.
  • Keywords
    integrated circuits; radiation hardening (electronics); semiconductor lasers; test facilities; PICO-4 single event effect evaluation; SEE simulation facility; laser source; microelectronic devices; space environment; testing facility; wavelength tunable picosecond laser; Laser beams; Measurement by laser beam; Optical attenuators; Radiation effects; Semiconductor device measurement; Semiconductor lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2012 IEEE
  • Conference_Location
    Tucson, AZ
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4673-2730-5
  • Type

    conf

  • DOI
    10.1109/REDW.2012.6353726
  • Filename
    6353726
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2245142