DocumentCode
2245210
Title
Surges, transients and naval systems
Author
Turner, R.M.
Author_Institution
Defence Evaluation & Res. Agency, West Drayton
fYear
1998
fDate
35844
Firstpage
42401
Lastpage
42409
Abstract
A fighting platform such as a ship or submarine is bristling with electronic warfare systems, communications systems, radar, sonar and many electrical power systems-to name but a few. All of these can potentially emit high powered electromagnetic waves which can so easily interfere with other items of equipment fitted on board. These systems face a threat from another quarter-those of conducted transients, induced predominantly via cables, interfering with, and possibly causing damage to, all types of equipment. Sources of such transients are numerous and include lightning, electrostatic discharge (ESD), nuclear electromagnetic pulse (NEMP) and transients caused by load changes and inductive switching of 440 V 60 Hz and other main power supplies. DERA West Drayton have been instrumental in the long term monitoring and protection of naval systems against many conducted transient threats, particularly those on power supply lines. This experience has also led to the publishing of two specialist test techniques in the UK´s tri-service EMC Defence Standard 59-41 as test supplements DCS11 and DCS 12. This paper summarises experience gained during monitoring of shipboard supplies and EMC testing
Keywords
ships; DERA West Drayton; EMC testing; ESD; NEMP; communications systems; conducted transients; electrical power systems; electromagnetic waves emission; electronic warfare systems; electrostatic discharge; inductive switching; lightning; load changes; monitoring; naval systems; nuclear electromagnetic pulse; power supplies; protection; radar; ship; shipboard supplies monitoring; sonar; submarine; surges; test supplement DCS11; test supplement DCS12; test techniques; transients; tri-service EMC Defence Standard 59-41;
fLanguage
English
Publisher
iet
Conference_Titel
Surges, Transients and EMC (Ref. No. 1998/184), IEE Colloquium on
Conference_Location
London
Type
conf
DOI
10.1049/ic:19980002
Filename
666467
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