DocumentCode :
2245219
Title :
Efficient error-cancelling algorithmic ADC
Author :
Zheng, Z. ; Min, B. ; Moon, U. ; Temes, G.
Author_Institution :
Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
451
Abstract :
An algorithmic ADC that is insensitive to capacitor mismatch and finite opamp gain and offset is described. Using the differential sampling scheme together with the correlated double sampling (CDS) technique, the virtually error-free and fast multiply-by-two operation is obtained for the proposed ADC. For an N-bit converter, a new output word is obtained every 4N clock periods, and this represents a significant improvement in conversion speed (or efficiency) in comparison to the latest work to achieve the same error compensation. Thus it can be used in applications which require low-cost medium-speed and high-resolution A/D conversion
Keywords :
CMOS integrated circuits; analogue-digital conversion; error compensation; signal sampling; 0.18 micron; 1.8 V; 16 bit; 4 mW; capacitor mismatch; correlated double sampling technique; differential sampling scheme; double-poly CMOS process; error compensation; error-cancelling algorithmic ADC; fast multiply-by-two operation; finite opamp gain; high-resolution A/D conversion; opamp gain and offset; Capacitors; Circuits; Clocks; Computer errors; Costs; Data conversion; Moon; Sampling methods; Signal processing algorithms; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on
Conference_Location :
Geneva
Print_ISBN :
0-7803-5482-6
Type :
conf
DOI :
10.1109/ISCAS.2000.857128
Filename :
857128
Link To Document :
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