• DocumentCode
    2245464
  • Title

    A mechanical reliability assessment of solder joints

  • Author

    Kishimoto, K. ; Omiya, M. ; Amagai, M.

  • Author_Institution
    Dept. of Mech. & Control Eng., Tokyo Inst. of Technol., Japan
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    8
  • Lastpage
    14
  • Abstract
    A mechanical reliability of the solder joints is a serious concern. Intermetallic compounds are formed during reflow process between solder and electrical pads and gradually grow in service. Due to it´s brittle manner, the reliability of solder joints are supposed to degenerate. By using the Cu-plates on which Cu or Ni or Ni+Au plating was deposited, and solders (Sn-Pb solders or Sn-Ag-Cu solders), specimens of solder joints were fabricated. After aging it in an isothermal chamber, tensile tests were performed and the relationships between solder joint strength and aging period were considered. From SEM microscope observation and EDX microprobe analysis, the growth and components of the intermetallic compounds layer were examined. To investigate the stress condition on the solder joint interface, the finite element analysis was also carried out
  • Keywords
    X-ray chemical analysis; ageing; finite element analysis; reflow soldering; reliability; scanning electron microscopy; tensile testing; EDX microprobe analysis; SEM observation; Sn-Ag-Cu; Sn-Pb; aging period; electrical pads; finite element analysis; intermetallic compounds; isothermal chamber; mechanical reliability assessment; reflow process; solder joint strength; solder joints; stress condition; tensile tests; Aging; Finite element methods; Intermetallic; Isothermal processes; Numerical analysis; Performance evaluation; Scanning electron microscopy; Soldering; Tensile stress; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging, 2001. EMAP 2001. Advances in
  • Conference_Location
    Jeju Island
  • Print_ISBN
    0-7803-7157-7
  • Type

    conf

  • DOI
    10.1109/EMAP.2001.983948
  • Filename
    983948