DocumentCode :
2245532
Title :
[2012 REDW welcome message]
fYear :
2012
fDate :
16-20 July 2012
Abstract :
The Radiation Effects Data Workshop (REDW) is part of the Nuclear and Space Radiation Effects Conference (NSREC) Technical Program. It is held as a separate poster session with a separate workshop record publication. Since its inception, it has provided an important forum for researchers to publish a wide range of radiation related data. The workshop record is published each year as a permanent archive of the REDW papers. This year, the posters were presented on 19 July 2012 at Intercontinental Miami Hotel in Miami, FL, USA. The 2012 workshop record has 34 high-quality papers covering a broad range of topics including: total ionizing dose, displacement damage, and single particle effects on a large number of electronic devices; integrated circuits and detectors; test methodologies; environment and facilities. In addition, this year??s workshop record contains several data compendium papers that present radiation test data on a wide variety of microelectronic components, which were tested for a broad range of radiation effects. Although the workshop record does provide a cumulative index that can be used to locate papers based on author and title, it is difficult to search for specific data on a particular part number, type, or radiation effect. To simplify this activity, searchable tables covering the REDW publications are also available on the NSREC website at www.nsrec.com/redw.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2012 IEEE
Conference_Location :
Miami, FL, USA
ISSN :
2154-0519
Print_ISBN :
978-1-4673-2730-5
Type :
conf
DOI :
10.1109/REDW.2012.6353740
Filename :
6353740
Link To Document :
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