DocumentCode :
2245577
Title :
2012 REDW [Copyright notice]
fYear :
2012
fDate :
16-20 July 2012
Abstract :
The following topics are dealt with: radiation hardening; spacecraft electronics; single event effects; SRAM; FPGA; analog-digital converter; BiCMOS technology; and heterojunction bipolar transistors.
Keywords :
BiCMOS integrated circuits; SRAM chips; analogue-digital conversion; field programmable gate arrays; heterojunction bipolar transistors; radiation hardening (electronics); space vehicle electronics; BiCMOS technology; FPGA; SRAM; analog-digital converter; heterojunction bipolar transistors; radiation hardening; single event effects; spacecraft electronics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2012 IEEE
Conference_Location :
Tucson, AZ
ISSN :
2154-0519
Print_ISBN :
978-1-4673-2730-5
Type :
conf
DOI :
10.1109/REDW.2012.6353742
Filename :
6353742
Link To Document :
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