Title :
Compendium of Recent Test Results of Single Event Effects Conducted by the Jet Propulsion Laboratory
Author :
Allen, Gregory R. ; Guertin, Steven M. ; Scheick, Leif Z. ; Irom, Farokh ; Zajac, Stephanie
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
This paper reports heavy ion, proton, and laser induced single event effects results for a variety of microelectronic devices targeted for possible use in NASA spacecrafts. The compendium covers devices tested within the years of 2010 through 2012.
Keywords :
integrated circuit testing; radiation hardening (electronics); NASA spacecrafts; heavy ion; jet propulsion laboratory; laser induced single event effects; microelectronic devices; proton; single event effect testing; Ions; Laboratories; Lasers; Performance evaluation; Propulsion; Radiation effects;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2012 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4673-2730-5
DOI :
10.1109/REDW.2012.6353747
