DocumentCode
2245759
Title
Electroencephalogram recording system
Author
Gaidhani, Atul G. ; Chuadhari, D.S.
Author_Institution
Dept. of Electron., S.G.G.S. Coll. of Eng. & Technol., Maharashtra, India
fYear
1995
fDate
15-18 Feb 1995
Firstpage
42425
Lastpage
42426
Abstract
An electroencephalogram (EEG) instrument has been successfully developed and tested for recording, visual and aural indication, electrode contact testing and biofeedback using discrete components. The key idea is to identify the different brain waves (delta, theta, alpha, beta) with separate audio/visual indication on the front panel. As the EEG signal lies in the range of 0.5 to 100 Hz, a notch filter is designed to eliminate the 50 Hz supply frequency. The brainwaves can be observed on the CRO (cathode ray oscilloscope) screen. The biofeedback technique is implemented by identifying the brain waves from audio/visual indications. The instrument also helps in checking the proximity of electrode on the scalp. The instrument is designed to generate distinct audio alarms for different brain waves. The paper also focuses on computer interfacing for record of EEG patterns. The instrument provides alpha relaxation technique by announcing the present status of the brain
Keywords
biomedical equipment; electroencephalography; feedback; notch filters; recorders; test equipment; 0.5 to 100 Hz; EEG instrument; EEG signal; alpha; audio/visual indication; beta; biofeedback technique; biofeedback using discrete components; brain waves identification; delta; electrode contact testing; electroencephalogram recording system; front panel; medical instrumentation; notch filter; theta; Audio recording; Biological control systems; Disk recording; Electrodes; Electroencephalography; Filters; Frequency; Instruments; Signal design; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 1995 and 14th Conference of the Biomedical Engineering Society of India. An International Meeting, Proceedings of the First Regional Conference., IEEE
Conference_Location
New Delhi
Print_ISBN
0-7803-2711-X
Type
conf
DOI
10.1109/RCEMBS.1995.511719
Filename
511719
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