Title :
Imaging properties of a metamaterial superlens
Author :
Fang, Nicholas ; Zhang, Xiang
Author_Institution :
Dept. of Mech. & Aerosp. Eng., California Univ., Los Angeles, CA, USA
Abstract :
The subwavelength imaging quality of a metamaterial superlens is studied numerically in the wavevector domain. Examples of image compression and magnification are given and resolution limits are discussed. A minimal resolution of λ/6 is obtained using a 36 nm silver film at 364 nm wavelength. The simulation also demonstrates the power flux is no longer a good measure to determine the focal plane of a superlens due the elevated field strength at the exit side of the metamaterial slab.
Keywords :
image resolution; lenses; metallic thin films; microlenses; microwave materials; optical transfer function; silver; 36 nm; 364 nm; Ag; focal plane; image compression; imaging properties; magnification; metamaterial superlens; optical transfer function; resolution limits; silver film; subwavelength imaging quality; wavevector domain; Focusing; Image resolution; Lenses; Metamaterials; Optical imaging; Optical propagation; Optical refraction; Permeability; Permittivity; Slabs;
Conference_Titel :
Nanotechnology, 2002. IEEE-NANO 2002. Proceedings of the 2002 2nd IEEE Conference on
Print_ISBN :
0-7803-7538-6
DOI :
10.1109/NANO.2002.1032233
