Title :
Reconstruction of one-dimensional lossy dielectric profiles
Author :
Mazzarella, G. ; Panariello, G.
Author_Institution :
Istituto di Elettrotecnica, Cagliari Univ., Italy
Abstract :
A reconstruction method for one-dimensional lossless dielectric profiles has been generalized to the lossy case, starting from the measurement of the sum of the short-circuit and the open-circuit reflection coefficient. The unknown profiles are expressed as a Volterra series and the linear terms computed by a spectral estimation from the TEM reflection coefficient. Some preliminary results show the effectiveness of the approach.
Keywords :
Volterra series; dielectric materials; electromagnetic wave reflection; electromagnetic wave scattering; image reconstruction; inverse problems; spectral analysis; TEM reflection coefficient; Volterra series; linear terms; one-dimensional lossy dielectric profiles; open-circuit reflection coefficient; reconstruction method; short-circuit reflection coefficient; spectral estimation; Conductivity; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Integral equations; Loss measurement; Optical reflection; Reconstruction algorithms; Slabs; Velocity measurement;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1995. AP-S. Digest
Conference_Location :
Newport Beach, CA, USA
Print_ISBN :
0-7803-2719-5
DOI :
10.1109/APS.1995.530889
