DocumentCode
2245940
Title
Characterization of the effect of small perturbations on the optical modes in high Q microdisk cavities
Author
Eftekhar, Ali Asghar ; Soltani, Mohammad ; Yegnanarayanan, Siva ; Adibi, Ali
Author_Institution
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA
fYear
2008
fDate
4-9 May 2008
Firstpage
1
Lastpage
2
Abstract
We have investigated the effect of small perturbations on the optical modes in a silicon microdisk using a NSOM system. The scattering loss and mode coupling due to NSOM tip and cavity interactions are studied.
Keywords
cavity resonators; elemental semiconductors; micro-optomechanical devices; microcavities; micromechanical resonators; near-field scanning optical microscopy; optical losses; silicon; NSOM system; Si; high Q microdisk cavities; mode coupling; optical modes; scattering loss; silicon microdisk; Light scattering; Nonlinear optics; Optical coupling; Optical microscopy; Optical scattering; Optical sensors; Optical waveguides; Particle scattering; Rayleigh scattering; Resonance light scattering; (130.3120) Integrated optics devices; (180.4243) Near-field microscopy;
fLanguage
English
Publisher
iet
Conference_Titel
Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
Conference_Location
San Jose, CA
Print_ISBN
978-1-55752-859-9
Type
conf
Filename
4571862
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