DocumentCode :
2246100
Title :
Tbit/inch/sup 2/ ferroelectric data storage using scanning nonlinear dielectric microscopy
Author :
Cho, Yasuo ; Fujimoto, Kenjiro ; Hiranaga, Yoshiomi ; Liu, Jie ; Wagatuma, Yasuo ; Onoe, Atsushi ; Terabe, Kazuya ; Kitamura, Kenji
Author_Institution :
Toboku University
fYear :
2002
fDate :
28-28 Aug. 2002
Firstpage :
255
Lastpage :
259
Keywords :
Atomic force microscopy; Dielectric constant; Ferroelectric materials; Laboratories; Magnetic materials; Memory; Polarization; Probes; US Department of Transportation; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2002. IEEE-NANO 2002. Proceedings of the 2002 2nd IEEE Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-7538-6
Type :
conf
DOI :
10.1109/NANO.2002.1032241
Filename :
1032241
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2246100
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