DocumentCode :
2246446
Title :
Test methods and test equipment for surges and transients
Author :
Young, S.N.
fYear :
1998
fDate :
35844
Firstpage :
42552
Lastpage :
42558
Abstract :
This paper looks at the surges and transients that are causing increasing problems for the designers and users of modern electrical and electronic devices. In order to investigate the effects of transients, and more importantly to verify that protective measures designed into the devices are adequate, simulation of real world transients is required. The paper investigates the test equipment required and the test methods and set-ups used for testing
fLanguage :
English
Publisher :
iet
Conference_Titel :
Surges, Transients and EMC (Ref. No. 1998/184), IEE Colloquium on
Conference_Location :
London
Type :
conf
DOI :
10.1049/ic:19980007
Filename :
666472
Link To Document :
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