DocumentCode :
2246749
Title :
Ion Beam Alignment of Liquid Crystal on SiOC Films
Author :
Son, Phil Kook ; Kim, Jae Chang ; Yoon, Tae-Hoon
Author_Institution :
Sch. of Electr. Eng., Pusan Nat. Univ., Pusan
fYear :
2007
fDate :
26-31 Aug. 2007
Firstpage :
1
Lastpage :
2
Abstract :
We investigated vertical alignment of liquid crystal (LC) on SiOC films deposited at the room temperature. We found from the electrostatic force microscopy (EFM) data that Coulomb interaction between LC and the ionized film surface has a dominant effect upon LC alignment on inorganic film surfaces by the ion beam exposure.
Keywords :
ion beams; liquid crystals; molecular orientation; silicon compounds; Coulomb interaction; SiOC; electrostatic force microscopy; inorganic film surface; ion beam alignment; ion beam exposure; ionized film; liquid crystal; temperature 293 K to 298 K; vertical alignment; Electric potential; Electrostatics; Ion beams; Liquid crystals; Polyimides; Rough surfaces; Surface discharges; Surface morphology; Surface roughness; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics - Pacific Rim, 2007. CLEO/Pacific Rim 2007. Conference on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-1173-3
Electronic_ISBN :
978-1-4244-1174-0
Type :
conf
DOI :
10.1109/CLEOPR.2007.4391510
Filename :
4391510
Link To Document :
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