DocumentCode
2246749
Title
Ion Beam Alignment of Liquid Crystal on SiOC Films
Author
Son, Phil Kook ; Kim, Jae Chang ; Yoon, Tae-Hoon
Author_Institution
Sch. of Electr. Eng., Pusan Nat. Univ., Pusan
fYear
2007
fDate
26-31 Aug. 2007
Firstpage
1
Lastpage
2
Abstract
We investigated vertical alignment of liquid crystal (LC) on SiOC films deposited at the room temperature. We found from the electrostatic force microscopy (EFM) data that Coulomb interaction between LC and the ionized film surface has a dominant effect upon LC alignment on inorganic film surfaces by the ion beam exposure.
Keywords
ion beams; liquid crystals; molecular orientation; silicon compounds; Coulomb interaction; SiOC; electrostatic force microscopy; inorganic film surface; ion beam alignment; ion beam exposure; ionized film; liquid crystal; temperature 293 K to 298 K; vertical alignment; Electric potential; Electrostatics; Ion beams; Liquid crystals; Polyimides; Rough surfaces; Surface discharges; Surface morphology; Surface roughness; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics - Pacific Rim, 2007. CLEO/Pacific Rim 2007. Conference on
Conference_Location
Seoul
Print_ISBN
978-1-4244-1173-3
Electronic_ISBN
978-1-4244-1174-0
Type
conf
DOI
10.1109/CLEOPR.2007.4391510
Filename
4391510
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