Title :
On an Efficient Closed Form Expression to Estimate the Crosstalk Noise in the Circuit with Multiple Wires
Author :
Chang, Po-Hao ; Chen, Jia-Ming ; Shen, Chao-Ying
Author_Institution :
Dept. of Electr. Eng., Nat. Dong Hwa Univ., Hualien
Abstract :
In recent years, as the density of the components in the integrated circuit grows, the distance between the on-chip wires becomes smaller. The crosstalk is more important and will change the signal waveform or generate logic failures and then degrade the performance and the reality of the circuit. In this paper, we focus on the value of the crosstalk noise. We find a new closed-form expression to derive a general formula for n wires and take two wires and three wires for examples. We refer to the 0.18-mum technology and utilize our approach to estimate the crosstalk noise. As a result, our average error percentage is below 10%
Keywords :
RC circuits; crosstalk; failure analysis; integrated circuit interconnections; integrated circuit noise; logic circuits; 0.18 micron; RC circuit; closed form expression; crosstalk noise; integrated circuit; logic failures; on-chip wires; signal waveform; Capacitance; Circuit simulation; Closed-form solution; Coupling circuits; Crosstalk; Integrated circuit interconnections; Integrated circuit noise; Noise level; Space vector pulse width modulation; Wires; RC circuit; coupled; crosstalk; multiple wires; noise;
Conference_Titel :
Circuits and Systems, 2006. APCCAS 2006. IEEE Asia Pacific Conference on
Conference_Location :
Singapore
Print_ISBN :
1-4244-0387-1
DOI :
10.1109/APCCAS.2006.342429
