Title :
Wafer level applied near-hermetic protection for semiconductors
Author :
Reusnow, Charles
Author_Institution :
Lockheed Martin Missiles & Fire Control - Dallas, TX, USA
Abstract :
Military electronic parts are becoming unavailable. Weapon system designers are forced to use commercial plastic encapsulated microcircuits (PEMs). PEMs are susceptible to moisture related failure mechanisms occurring from long-term exposure to moisture even at very low humidity levels. Weapon systems must operate reliably after long-term dormant storage sometimes greater than 30 years. An Army Aviation and Missile Command Manufacturing Technology program is reviewed that provides a process for a potential near-hermetic wafer level seal for long term moisture exposure protection of PEMs. The process also provides potential benefits to the commercial semiconductor manufacturing community
Keywords :
corrosion protection; failure analysis; integrated circuit packaging; integrated circuit reliability; military equipment; military systems; moisture; plastic packaging; seals (stoppers); weapons; 30 year; Army Aviation and Missile Command Manufacturing Technology program; PEMs; humidity levels; long term moisture exposure protection; long-term dormant storage; long-term moisture exposure; military electronic parts; moisture related failure mechanisms; near-hermetic wafer level seal; plastic encapsulated microcircuits; semiconductor devices; semiconductor manufacturing; wafer level applied near-hermetic protection; weapon system design; weapon systems operational reliability; Failure analysis; Humidity; Manufacturing processes; Missiles; Moisture; Plastics; Protection; Seals; Semiconductor device manufacture; Weapons;
Conference_Titel :
Electronic Materials and Packaging, 2001. EMAP 2001. Advances in
Conference_Location :
Jeju Island
Print_ISBN :
0-7803-7157-7
DOI :
10.1109/EMAP.2001.984001