• DocumentCode
    2246899
  • Title

    Study on microstructure and shear strength of Sn-Ag-Sb solder joints

  • Author

    Lee, Hwa-Teng ; Liao, Tain-Long ; Chen, Ming-Hung

  • Author_Institution
    Dept. of Mech. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    315
  • Lastpage
    322
  • Abstract
    This study investigates the microstructure, intermetallic compound (IMC) morphology and shear strength of Sn4.38Ag solder joints with different percentages of Sb content. The paper also evaluates, and compares, the thermal resistance of solder joints with different Sb content by means of high temperature storage testing. In order to achieve solder joints of the size found in the BGA package, this study used pure copper wires of 1 mm diameter as substrates for hot-dipping soldering. Solders with different compositions were selected for investigation, namely Sn4.38Ag, Sn3.9Ag0.9Sb, Sn4.4Ag1.44Sb and Sn4.11Ag1.86Sb, while a Sn40Pb solder was chosen for comparison purposes. High temperature storage testing was performed after soldering, with storage temperatures of 150°C and 200°C, respectively, and storage times of 0, 25, 100, 228 and 625 hours, respectively. Experimental results show that most of the Sb which is added to the solder is soluted in the β-Sn matrix, with the remainder reacting with the Sn and Ag atoms to form an ε-Ag3 (Sn,Sb) compound
  • Keywords
    antimony alloys; ball grid arrays; life testing; shear strength; silver alloys; soldering; thermal resistance; tin alloys; 0 to 625 hr; 1 mm; 150 degC; 200 degC; BGA package; Sn-Ag-Sb; high temperature storage testing; hot-dipping soldering; intermetallic compound morphology; microstructure; shear strength; solder joints; storage temperatures; storage times; thermal resistance; Copper; Intermetallic; Microstructure; Morphology; Packaging; Soldering; Temperature; Testing; Thermal resistance; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging, 2001. EMAP 2001. Advances in
  • Conference_Location
    Jeju Island
  • Print_ISBN
    0-7803-7157-7
  • Type

    conf

  • DOI
    10.1109/EMAP.2001.984003
  • Filename
    984003