• DocumentCode
    2247117
  • Title

    Optimum Supply and Threshold Voltages and Transistor Sizing Effects on Low Power SOI Circuit Design

  • Author

    Emadi, M. ; Jafargholi, A. ; Moghadam, H. Sargazi ; Nayebi, M.M.

  • Author_Institution
    Dept. of Electr. Eng., Sharif Univ. of Technol., Tehran
  • fYear
    2006
  • fDate
    4-7 Dec. 2006
  • Firstpage
    1394
  • Lastpage
    1398
  • Abstract
    This work introduces a new model for energy-delay product and the performance of 80-nm SOI-CMOS circuits for the range of Vdd=0.1- 1.5V and Vth= 0 - 0.8V, are analyzed to find optimal Vdd and Vth. BSIMSOI3.3 model (level 57) is used to verify the answers. The authors show that energy-delay product (EDP) isn´t appropriate metric for gate sizing problem. And a new design metric is introduced as a generalization of EDP. This metric is used to determine the transistor sizing for complex circuits based on the specified delay and energy constrains. In this case, unlike the conventional energy delay product metric, delay and energy can be considered with different emphasis. The complete design flowcharts and the formulations for finding the optimum gate sizing are also presented. Theses algorithms can be implemented in a CAD tool too
  • Keywords
    CMOS integrated circuits; integrated circuit modelling; low-power electronics; network synthesis; silicon-on-insulator; 0 to 1.5 V; 80 nm; CAD tool; EDP contour; SOI-CMOS circuits; design flowcharts; energy-delay product; gate sizing problem; low power SOI circuit design; low power design; optimum supply voltage; threshold voltages; transistor sizing effects; CMOS technology; Circuit synthesis; Degradation; Delay; Energy consumption; MOSFETs; Power dissipation; Silicon on insulator technology; Threshold voltage; Very large scale integration; EDP contour; Energy-delay product; Low power design; Transistor sizing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2006. APCCAS 2006. IEEE Asia Pacific Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    1-4244-0387-1
  • Type

    conf

  • DOI
    10.1109/APCCAS.2006.342461
  • Filename
    4145661