Title :
An improved three-state master equation model for capacitively coupled single-electron transistor
Author :
Hu, C.H. ; Jiang, J.F. ; Cai, Q.Y.
Author_Institution :
Res. Inst. of Micro/Nano Sci. & Technol., Shanghai Jiao Tong Univ., China
Abstract :
In this paper, we develop an improved semi-classical steady-state model for capacitively coupled single-electron transistor (SET). This SET model is based on the three-state steady-state master equation, but has some revision at different device parameters, and is thus called the improved three-state master equation model. We calculate IDS-UDD, IDS-UG, and GDS-UDD characteristics for different device parameters. We also present corresponding characteristics calculated by the Monte Carlo method and the full master equation method in most cases. The results demonstrate that the new approach is comparable to the Monte Carlo method and the full master equation method in precision, even in the high voltage region of VDS, and it simplifies the calculation and improves the speed of numerical simulation. This model can easily be embedded in the SPICE program. Of course, the validity of this embedded model depends on whether the SET can be regarded as a separate component in the circuit.
Keywords :
Monte Carlo methods; SPICE; electric current; master equation; semiconductor device models; single electron transistors; Monte Carlo method; SET characteristics; SPICE embedded model; capacitively coupled SET model; capacitively coupled single-electron transistor; device parameters; full master equation method; high voltage region; model validity; numerical simulation; semi-classical steady-state model; three-state master equation model; three-state steady-state master equation; Capacitance; Circuit simulation; Coupling circuits; Differential equations; Numerical simulation; SPICE; Single electron devices; Single electron transistors; Steady-state; Voltage;
Conference_Titel :
Nanotechnology, 2002. IEEE-NANO 2002. Proceedings of the 2002 2nd IEEE Conference on
Print_ISBN :
0-7803-7538-6
DOI :
10.1109/NANO.2002.1032293