Title :
Large pure refractive nonlinearity of nanostructure silica aerogel at near infrared wavelength
Author :
Seo, J.T. ; Yang, Qingxiong ; Creekmore, S. ; Temple, D.
Author_Institution :
Dept. of Phys., Hampton Univ., VA, USA
Abstract :
The nonlinear refraction coefficient of the third-order susceptibility of silica aerogel was estimated to be ∼-1.5×10-15 m2/W (∼-3.67×10-9 esu) by a signal-beam z-scan technique with ∼1 ps Ti:sapphire lasers. The third-order nonlinear refraction coefficient of nanostructure silica aerogel is almost five orders larger than the nonlinear (χ3) refraction of bulk material. The large nonlinear refraction originates mainly from the direct excitation to the surface trapped states, and the one-photon resonance process.
Keywords :
aerogels; light refraction; measurement by laser beam; nanostructured materials; nonlinear optical susceptibility; optical limiters; resonance; silicon compounds; surface states; Al2O3:Ti; SiO2; Ti:sapphire lasers; direct excitation; nanostructure silica aerogel; near infrared wavelength; nonlinear refraction; nonlinear refraction coefficient; optical power self-limiting applications; pure refractive nonlinearity; signal-beam z-scan technique; single-photon resonance process; surface trapped states; third-order nonlinear refraction coefficient; third-order susceptibility; Biomedical optical imaging; Chemical and biological sensors; Nanobioscience; Nanomaterials; Nonlinear optics; Optical refraction; Optical sensors; Optical surface waves; Optical variables control; Silicon compounds;
Conference_Titel :
Nanotechnology, 2002. IEEE-NANO 2002. Proceedings of the 2002 2nd IEEE Conference on
Print_ISBN :
0-7803-7538-6
DOI :
10.1109/NANO.2002.1032296
