• DocumentCode
    2247361
  • Title

    Synthesis of Finite State Machines for Low Power and Testability

  • Author

    Chaudhury, Saurabh ; Chattopadhyay, Santanu ; Rao, J. Srinivasa

  • Author_Institution
    Dept. of Electr. & Electron. Comput. Eng., IIT, Kharagpur
  • fYear
    2006
  • fDate
    4-7 Dec. 2006
  • Firstpage
    1434
  • Lastpage
    1437
  • Abstract
    State encoding is an essential step for sequential circuit synthesis, especially when area, delay and/or power consumption are the main emphasis. Sequential circuits consume a considerable amount of power, as these are used to implement control circuitry, which remains always active even when some of the data-paths are shutdown. With the rapid advancement in VLSI technology and device miniaturization testing of these circuits is also getting equal importance. A unique scheme of testability measure is introduced to the proposed method and a trade-off is done for power and testability. All these key ideas - partitioning, state encoding and testability in the synthesis process and applied genetic algorithm (GA) have been included to find near optimal solution. It is found that average improvement in power consumption of 16.47% over NOVA when the weightage on testability is set to 0.2 and average fault coverage of 99.39% is achieved when the weightage is 0.8, which is superior to other synthesis tool such as NOVA
  • Keywords
    circuit optimisation; finite state machines; genetic algorithms; logic CAD; logic partitioning; logic testing; sequential circuits; VLSI technology; applied genetic algorithm; circuit testing; device miniaturization; finite state machines synthesis; power consumption; sequential circuit synthesis; state encoding; testability measure; Automata; Circuit synthesis; Circuit testing; Delay; Encoding; Energy consumption; Genetic algorithms; Power measurement; Sequential circuits; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2006. APCCAS 2006. IEEE Asia Pacific Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    1-4244-0387-1
  • Type

    conf

  • DOI
    10.1109/APCCAS.2006.342471
  • Filename
    4145671