DocumentCode :
2247905
Title :
Micromachined tunneling accelerometer with a low-voltage CMOS interface circuit
Author :
Yeh, Chingwen ; Najafi, Khalil
Author_Institution :
Input/Output Inc., Stafford, TX, USA
Volume :
2
fYear :
1997
fDate :
16-19 Jun 1997
Firstpage :
1213
Abstract :
Three types of low-voltage CMOS interface circuitry for a micromachined tunneling accelerometer have been designed, fabricated, and tested. One of these uses a pn-junction diode as a logarithmic current-to-voltage converter and has the best performance. Only one single 12 V power supply is required for device operation and the total power dissipation is 2.5 mW. With an active area of 400×400 μm 2 (the proof-mass and support cantilever beams), the accelerometer has an on-axis sensitivity of 125 mV/g, 3 dB bandwidth of 2.5 kHz, and measurement range of 30 g. The noise equivalent acceleration with a 1/f behavior drops from 4 mg/√Hz to 0.1 mg/√Hz, thus corresponding to a minimum resolution of 8 mg and dynamic range of 71 dB. After one month of continuous operation, the device shows a sensitivity and offset drift of less than 0.5%. The hybrid sensor-circuit module requires a much simpler interface circuit than capacitive accelerometers, which generally need monolithic sensor-circuit integration and complex design of signal processing to provide comparable performance
Keywords :
1/f noise; CMOS analogue integrated circuits; accelerometers; analogue processing circuits; integrated circuit design; integrated circuit noise; integrated circuit testing; microsensors; signal processing equipment; tunnelling; 1/f behavior; 12 V; 2.5 kHz; 2.5 mW; 3 dB bandwidth; circuit design; circuit fabrication; circuit testing; dynamic range; hybrid sensor-circuit module; logarithmic current-to-voltage converter; low-voltage CMOS interface circuit; measurement range; micromachined tunneling accelerometer; minimum resolution; noise equivalent acceleration; offset drift; on-axis sensitivity; pn-junction diode; power supply; proof-mass beam; signal processing; support cantilever beam; total power dissipation; Acceleration; Accelerometers; Area measurement; Bandwidth; Circuit testing; Diodes; Power dissipation; Power supplies; Structural beams; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Sensors and Actuators, 1997. TRANSDUCERS '97 Chicago., 1997 International Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-3829-4
Type :
conf
DOI :
10.1109/SENSOR.1997.635426
Filename :
635426
Link To Document :
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