Title :
Modeling noise coupling from non-parallel PCB trace routing
Author :
Luan, Shaofeng ; Xiao, Fengchao ; Liu, Weikun ; Fan, Jun ; Kami, Yoshio ; Drewniak, James L. ; Dubroff, Richard E.
Author_Institution :
EMC Lab., Missouri Univ., Rolla, MO, USA
Abstract :
Coupling between PCB signal traces in proximity is of concern to PCB designers and EMC engineers. The behavior of noise coupling between nonparallel microstrip lines is studied in this paper by a full-wave numerical modeling method CEMPIE, designating a circuit extraction approach based on a mixed-potential integral equation formulation. Good agreement between the numerical results and measurements was obtained.
Keywords :
electromagnetic compatibility; electromagnetic interference; integral equations; microstrip lines; printed circuits; EMC engineers; PCB designers; PCB signal traces coupling; circuit extraction approach; full-wave numerical modeling method; mixed-potential integral equation; noise coupling modelling; nonparallel PCB trace routing; nonparallel microstrip lines; Circuit noise; Coupling circuits; Design engineering; Design methodology; Electromagnetic compatibility; Integral equations; Microstrip; Numerical models; Routing; Signal design;
Conference_Titel :
Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on
Conference_Location :
Minneapolis, MN, USA
Print_ISBN :
0-7803-7264-6
DOI :
10.1109/ISEMC.2002.1032457
