DocumentCode
2248413
Title
Ellipsoidal surface characterization for validating the UTD formulation
Author
Choudhury, R. ; Jha, R.M.
Author_Institution
Div. of Aerosp. Electron. & Syst., Nat. Aerosp. Lab., Bangalore, India
Volume
4
fYear
1995
fDate
18-23 June 1995
Firstpage
1922
Abstract
The UTD mutual coupling results are presented for an ellipsoid of revolution, for slots located arbitrarily on the surface. Rigorous 3-dimensional ray tracing has been performed by the geodesic constant method. The ellipsoid of revolution, with unequal double curvature surfaces without any edges, provides an ideal surface for verifying the heuristics involved in the UTD (surface-diffracted) formulation.
Keywords
geometrical theory of diffraction; ray tracing; UTD formulation; ellipsoid of revolution; ellipsoidal surface characterization; geodesic constant method; mutual coupling; radiation pattern; rigorous 3-dimensional ray tracing; surface-diffraction; Admittance; Antenna measurements; Antenna radiation patterns; Antennas and propagation; Diffraction; Ellipsoids; Integral equations; Mutual coupling; Optimization methods; Performance evaluation;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1995. AP-S. Digest
Conference_Location
Newport Beach, CA, USA
Print_ISBN
0-7803-2719-5
Type
conf
DOI
10.1109/APS.1995.530966
Filename
530966
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