Title :
Non-axial-scanning second harmonic microscopy
Author :
Yang, Chuan ; Shi, Kebin ; Li, Haifeng ; Xu, Qian ; Gopalan, Venkatraman ; Liu, Zhiwen
Author_Institution :
Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA, USA
Abstract :
We demonstrate a chromatic second harmonic imaging technique that exploits the chromatic aberration of a Fresnel lens to focus different wavelengths into different axial positions to effectively realize axial scanning and improve imaging speed.
Keywords :
Fresnel diffraction; aberrations; lenses; optical harmonic generation; optical microscopy; Fresnel lens; chromatic aberration; chromatic second harmonic imaging technique; non-axial-scanning second harmonic microscopy; Harmonic analysis; Laser beams; Lenses; Microscopy; Optical harmonic generation; Power harmonic filters;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2011 Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4577-1223-4
