DocumentCode
2248620
Title
Non-axial-scanning second harmonic microscopy
Author
Yang, Chuan ; Shi, Kebin ; Li, Haifeng ; Xu, Qian ; Gopalan, Venkatraman ; Liu, Zhiwen
Author_Institution
Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA, USA
fYear
2011
fDate
1-6 May 2011
Firstpage
1
Lastpage
2
Abstract
We demonstrate a chromatic second harmonic imaging technique that exploits the chromatic aberration of a Fresnel lens to focus different wavelengths into different axial positions to effectively realize axial scanning and improve imaging speed.
Keywords
Fresnel diffraction; aberrations; lenses; optical harmonic generation; optical microscopy; Fresnel lens; chromatic aberration; chromatic second harmonic imaging technique; non-axial-scanning second harmonic microscopy; Harmonic analysis; Laser beams; Lenses; Microscopy; Optical harmonic generation; Power harmonic filters;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics (CLEO), 2011 Conference on
Conference_Location
Baltimore, MD
Print_ISBN
978-1-4577-1223-4
Type
conf
Filename
5950961
Link To Document