DocumentCode
2248833
Title
Analysis of radiation caused by LSI package cross talk and cable by using the time-domain moment method
Author
Ohtsu, Shinichi ; Nagase, Kenji ; Yamagajou, Takeshi
Author_Institution
Corporate Component Eng. Center, Fujitsu Ltd., Kawasaki, Japan
Volume
1
fYear
2002
fDate
19-23 Aug. 2002
Firstpage
268
Abstract
We have developed the direct time-domain moment method, which is applicable to arbitrarily shaped models made of conductors and dielectrics. Using the method, we have analyzed the cross talk phenomenon within a LSI package. We have shown that, in the PCB with the LSI and a cable, the noise induced by the cross talk causes the strong radiation through the cable. Still more we have shown a remedy for the cross talk by simulations.
Keywords
cables (electric); crosstalk; electromagnetic interference; large scale integration; method of moments; printed circuits; time-domain analysis; LSI package cross talk; arbitrarily shaped models; cable; conductors; dielectrics; induced noise; radiation analysis; time-domain moment method; Aircraft; Communication cables; Current; Dielectrics; Frequency domain analysis; Large scale integration; Moment methods; Packaging; Time domain analysis; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on
Conference_Location
Minneapolis, MN, USA
Print_ISBN
0-7803-7264-6
Type
conf
DOI
10.1109/ISEMC.2002.1032487
Filename
1032487
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