DocumentCode :
2249032
Title :
Analysis on the effectiveness of the 20-H rule using numerical simulation technique
Author :
Li, Er-Ping ; Yuan, Wei-Liang ; Yi, Jiang ; Li, Le-Wei ; Montrose, Mark I.
Author_Institution :
EMC Div., Inst. of High Performance Comput., Singapore, Singapore
Volume :
1
fYear :
2002
fDate :
19-23 Aug. 2002
Firstpage :
328
Abstract :
With increasing demand for higher operating frequencies, printed circuit board (PCB) designers are faced with numerous obstacles during the design cycle. The 20-H rule is one layout technique that is recommended to minimize radiated fields propagating from the edges of a PCB. These fields, either magnetic or electric, may corrupt adjacent cable assemblies, sheet metal enclosures and aperture openings. The magnitude of this design rule is investigated herein using the numerical electromagnetic simulation method, finite difference time domain (FDTD). In addition, an analysis on whether benefits exist from use of the 20-H rule is examined. The significance to the field of EMC lies in presenting, for the first time, an exhaustive analysis that took over one year to achieve using various configurations and frequencies. A rigorous analysis indicates that benefits do occur from use of the 20-H rule, but only when implemented in certain applications.
Keywords :
electromagnetic compatibility; electromagnetic interference; finite difference time-domain analysis; printed circuit layout; 20-H rule; FDTD; PCB layout; aperture openings; finite difference time domain; high operating frequencies; layout technique; numerical electromagnetic simulation method; numerical simulation; printed circuit board; radiated fields propagation minimisation; sheet metal enclosures; Apertures; Assembly; Electromagnetic propagation; Electromagnetic radiation; Finite difference methods; Frequency; Magnetic domains; Numerical simulation; Printed circuits; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on
Conference_Location :
Minneapolis, MN, USA
Print_ISBN :
0-7803-7264-6
Type :
conf
DOI :
10.1109/ISEMC.2002.1032498
Filename :
1032498
Link To Document :
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