Title :
Room temperature nanoimprint technology
Author :
Igaku, Y. ; Matsui, S. ; Ishigaki, H. ; Fujita, J. ; Ishida, M. ; Ochiai, Y. ; Komuro, M. ; Hiroshima, H. ; Namatsu, H.
Author_Institution :
Himeji Inst. of Technol., Japan
fDate :
Oct. 31 2001-Nov. 2 2001
Abstract :
Nano-imprint-lithography (NIL) (Chou et al, 1997), in which resist patterns are fabricated by deforming the resist physical shape through embossing with a mold, is a very useful technique to make nanostructure devices and various nanostructure devices such as a quantized magnetic disk (Wu et al, 1998) have been demonstrated by this method. It has excellent features with sub-10 nm feature size over a large area with high throughput and low cost. However, as a conventional NIL process has to heat a resist above the glass transition temperature to deform the resist physical shape with a mold pattern, the heating process causes serious problems for pattern accuracy. To overcome this problem, room-temperature replication into SOG (spin-on-glass) and HSQ (hydrogen silsesquioxane) (Namatsu et al, 1998) has been proposed and experiments have been conducted. In this paper, we describe a room-temperature replication into SOG/HSQ and a pattern transfer to a metal pattern and a substrate by using lift-off and RIE processes.
Keywords :
deformation; glass transition; lithography; moulding; nanotechnology; plasma materials processing; resists; sputter etching; 10 nm; HSQ; NIL process; SOG; feature size; glass transition temperature; hydrogen silsesquioxane; lift-off/RIE processes; metal pattern; mold embossing; mold pattern; nano-imprint-lithography; nanostructure devices; pattern accuracy; pattern transfer; quantized magnetic disk; resist deformation; resist heating; resist patterns; resist physical shape; room temperature nanoimprint technology; room-temperature SOG/HSQ replication; room-temperature replication; spin-on-glass; throughput; Costs; Embossing; Glass; Heating; Magnetic devices; Nanoscale devices; Resists; Shape; Temperature; Throughput;
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2001 International
Conference_Location :
Shimane, Japan
Print_ISBN :
4-89114-017-8
DOI :
10.1109/IMNC.2001.984111