DocumentCode :
2249728
Title :
Thermal Driven Module Placement Using Sequence-pair
Author :
Okada, Norihide ; Kodama, Chikaaki ; Sato, Takashi ; Fujiyoshi, Kunihiro
Author_Institution :
Dept. of Electr. & Electron. Eng., Tokyo Univ. of Agric. & Technol.
fYear :
2006
fDate :
4-7 Dec. 2006
Firstpage :
1871
Lastpage :
1874
Abstract :
TThe increase of power consumption in recent VLSI chip has led to uneven thermal distribution and high temperature on the chip. This brings inappropriate distribution of wire delay and may adversely effect the behavior of the chip by the increase of clock skew. The rise of local temperature causes the electro migration which brings wire disconnections. Therefore, some module placement methods considering the thermal distribution were proposed so far. However, these conventional methods require much time for obtaining the placement. In this paper, we propose a method to quickly obtain a module placement with good thermal distribution. We confirmed that the proposed method with simulated annealing can obtain good placements in shorter time
Keywords :
VLSI; modules; simulated annealing; system-on-chip; VLSI chip; module placement; sequence pair; simulated annealing; thermal distribution; thermal driven; Agricultural engineering; Clocks; Delay effects; Energy consumption; Simulated annealing; Temperature distribution; Thermal engineering; Thermal force; Very large scale integration; Wire; module placement; sequence-pair; thermal driven;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2006. APCCAS 2006. IEEE Asia Pacific Conference on
Conference_Location :
Singapore
Print_ISBN :
1-4244-0387-1
Type :
conf
DOI :
10.1109/APCCAS.2006.342204
Filename :
4145780
Link To Document :
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